Field and current-induced magnetization reversal studied through spatially resolved point-contacts
2010 (English)In: Journal of Applied Physics, ISSN 0021-8979, E-ISSN 1089-7550, Vol. 107, no 10, 103909- p.Article in journal (Refereed) Published
ABSTRACT: We present results from scanning tunneling microscopy based point-contact measurements of the local resistance in octagon shaped, Co (20 nm )/ Cu (5 nm )/ Fe <sub>19</sub> Ni <sub>81</sub>(2.5 nm ) spin-valve rings. Through this technique one can detect the magnetoresistance with spatial resolution, and link it to magnetic domain wall motion within the ring. Measurements with varying currents indicate current-induced effects leading to offsets in the magnetic fields required for magnetic switching. The offsets can be attributed to current-induced spin-transfer torque effects for the thin Fe <sub>19</sub> Ni <sub>81</sub> layer and to Oersted field effects for the thick Co layer.
Full-text · Article · Jun 2010 · Journal of Applied Physics
Place, publisher, year, edition, pages
2010. Vol. 107, no 10, 103909- p.
Physical Sciences Engineering and Technology
Research subject Physics
IdentifiersURN: urn:nbn:se:uu:diva-284074OAI: oai:DiVA.org:uu-284074DiVA: diva2:919732