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The analysis of nanostructures and interface in vacuum annealed Si rich SiC film by 3D spectros electron tomography: use of spectrum imaging technique on transmission electron microscopy
Uppsala University, Disciplinary Domain of Science and Technology, Technology, Department of Engineering Sciences, Applied Materials Sciences.
Photovoltaic Materials and Devices, Delft University of Technology.
(Photovoltaic Materials and Devices, Delft Univeristy of Technology, P.O. Box 5031, 2600 GA Delft, The Netherlands)
(Photovoltaic Materials and Devices, Delft Univeristy of Technology, P.O. Box 5031, 2600 GA Delft, The Netherlands)
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2014 (English)Conference paper, Oral presentation with published abstract (Refereed)
Place, publisher, year, edition, pages
2014.
Keywords [en]
Electron tomography
National Category
Natural Sciences Engineering and Technology
Identifiers
URN: urn:nbn:se:uu:diva-285832OAI: oai:DiVA.org:uu-285832DiVA, id: diva2:921197
Conference
Annual Conference of the Nordic Microscopy Society, SCANDEM 2014, 11-13 June 2014, Linköping, Sweden.
Available from: 2016-04-19 Created: 2016-04-19 Last updated: 2016-04-26

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Xie, LingLeifer, Klaus

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