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3D electron tomography analysis of silicon nanoparticles in SiC matrices by quantitative determination of EELS plasmon intensities
Uppsala University, Disciplinary Domain of Science and Technology, Technology, Department of Engineering Sciences, Applied Materials Sciences.
Photovoltaic Materials and Devices, Delft University of Technology.
(Photovoltaic Materials and Devices, Delft Univeristy of Technology, P.O. Box 5031, 2600 GA Delft, The Netherlands)
(Photovoltaic Materials and Devices, Delft Univeristy of Technology, P.O. Box 5031, 2600 GA Delft, The Netherlands)
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2014 (English)Conference paper, Poster (with or without abstract) (Refereed)
Place, publisher, year, edition, pages
2014.
Keyword [en]
Electron tomography
National Category
Natural Sciences Engineering and Technology
Identifiers
URN: urn:nbn:se:uu:diva-285839OAI: oai:DiVA.org:uu-285839DiVA: diva2:921205
Conference
18th International Microscopy Congress, Prague.
Available from: 2016-04-19 Created: 2016-04-19 Last updated: 2016-04-26

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Xie, LingLeifer, Klaus

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