The potential of ion beams for characterization of metal-organic frameworks
2016 (English)Conference paper (Refereed)Text
Ion scattering has been employed for depth-profiling of metal organic frameworks (MOFs) to characterize the degree of post-synthetic uptake of [FeFe](mcbdt)(CO)(6) (mcbdt = 2,3-dithiolato-benzoic acid). The system investigated consisted of UiO-66 (UiO = University of Oslo) MOF thin films grown on p-type Si wavers in which a molecular proton reduction catalyst [FeFe](mcbdt)(CO)(6) was introduced by postsynthetic exchange (PSE). We have characterized samples by Rutherford Backscattering spectrometry (RBS), Time-of-Flight Elastic Recoil Detection analysis (TOF-ERDA) and by Time-of-Flight Medium Energy Ion Scattering (TOF-MEIS). The beam induced sample modification during the analysis has been characterized by Scanning Electron Microscopy (SEM). No detectable sample modification was found for RBS and TOF-MEIS whereas TOF-ERDA had a clear impact in the present experiment. Composition profiles could be obtained and indicated enrichment of catalyst and/or catalyst residual near to and at the sample surface.
Place, publisher, year, edition, pages
2016. Vol. 371, 327-331 p.
RBS, TOF-MEIS, TOF-ERDA, Metal-organic framework, Catalyst
Accelerator Physics and Instrumentation
IdentifiersURN: urn:nbn:se:uu:diva-295577DOI: 10.1016/j.nimb.2015.10.059ISI: 000373412000065OAI: oai:DiVA.org:uu-295577DiVA: diva2:941185
22nd International Conference on Ion Beam Analysis (IBA), JUN 14-19, 2015, Opatija, CROATIA