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Angular dependence of Al-2p X-ray yield spectra of GaAs/AlAs/GaAs heterostructures
Uppsala University.
Uppsala University.
Uppsala University.
1999 (English)In: JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, ISSN 0021-4922, Vol. 38, 572-575 p.Article in journal (Other scientific) Published
Abstract [en]

The X-ray emission yield by the Al-2p core-exciton excitation in GaAs/AlAs/GaAs heterostructures is studied theoretically: especially the angular correlation between absorbed and emitted X-rays are discussed. It becomes clear that the angular dependence o

Place, publisher, year, edition, pages
JAPAN J APPLIED PHYSICS , 1999. Vol. 38, 572-575 p.
Keyword [en]
X-ray absorption and emission; core exciton; polarization; electronic structure; ALXGA1-XAS
URN: urn:nbn:se:uu:diva-66598OAI: oai:DiVA.org:uu-66598DiVA: diva2:94509
Addresses: Inoue K, Osaka Univ, Inst Sci & Ind Res, 8-1 Mihogaoka, Ibaraki, Osaka 5670049, Japan. Osaka Univ, Inst Sci & Ind Res, Ibaraki, Osaka 5670049, Japan. Univ Uppsala, Dept Phys, S-75121 Uppsala, Sweden. Univ Tokyo, Inst Solid State Phys, SynchrotrAvailable from: 2008-10-17 Created: 2008-10-17 Last updated: 2011-01-14

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