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Spectroscopic study of CNx films grown by magnetron sputter deposition
Uppsala University.
Uppsala University.
Uppsala University.
Uppsala University.
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1999 (English)In: JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, ISSN 0368-2048, Vol. 103, 551-554 p.Article in journal (Other scientific) Published
Abstract [en]

The electronic structure of carbon nitride films has been studied using soft X-ray absorption and emission spectroscopy. Resonant N K-emission spectra show a strong dependence on excitation photon energies and the substrate temperatures, while C K-emissio

Place, publisher, year, edition, pages
ELSEVIER SCIENCE BV , 1999. Vol. 103, 551-554 p.
Keyword [en]
resonant X-ray emission spectroscopy; X-ray absorption; carbon nitride; X-RAY FLUORESCENCE; GRAPHITE; MICROSTRUCTURE; DIAMOND
Identifiers
URN: urn:nbn:se:uu:diva-67032OAI: oai:DiVA.org:uu-67032DiVA: diva2:94943
Note
Addresses: Guo JH, Univ Uppsala, Dept Phys, Box 530, S-75121 Uppsala, Sweden. Univ Uppsala, Dept Phys, S-75121 Uppsala, Sweden. Linkoping Univ, Dept Phys & Measurement Technol, S-58183 Linkoping, Sweden.Available from: 2008-10-17 Created: 2008-10-17 Last updated: 2011-01-14

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