uu.seUppsala University Publications
Change search
ReferencesLink to record
Permanent link

Direct link
A Simple Transmission Electron Microscopy Method for Fast Thickness Characterization of Suspended Graphene and Graphite Flakes
Uppsala University, Disciplinary Domain of Science and Technology, Technology, Department of Engineering Sciences, Applied Materials Sciences. Univ Victoria, Adv Microscopy Facil, Victoria, BC, Canada..
Uppsala University, Disciplinary Domain of Science and Technology, Technology, Department of Engineering Sciences, Applied Materials Sciences. Govt Coll Univ, Ctr Adv Studies Phys, Katchery Rd, Lahore 54000, Pakistan..
Uppsala University, Disciplinary Domain of Science and Technology, Technology, Department of Engineering Sciences, Applied Materials Sciences.
2016 (English)In: Microscopy and Microanalysis, ISSN 1431-9276, E-ISSN 1435-8115, Vol. 22, no 1, 250-256 p.Article in journal (Refereed) PublishedText
Abstract [en]

We present a simple, fast method for thickness characterization of suspended graphene/graphite flakes that is based on transmission electron microscopy (TEM). We derive an analytical expression for the intensity of the transmitted electron beam I-0(t), as a function of the specimen thickness t (t < < lambda; where lambda is the absorption constant for graphite). We show that in thin graphite crystals the transmitted intensity is a linear function of t. Furthermore, high-resolution (HR) TEM simulations are performed to obtain lambda for a 001 zone axis orientation, in a two-beam case and in a low symmetry orientation. Subsequently, HR (used to determine t) and bright-field (to measure I-0(0) and I-0(t)) images were acquired to experimentally determine lambda. The experimental value measured in low symmetry orientation matches the calculated value (i.e., lambda = 225 +/- 9 nm). The simulations also show that the linear approximation is valid up to a sample thickness of 3-4 nm regardless of the orientation and up to several ten nanometers for a low symmetry orientation. When compared with standard techniques for thickness determination of graphene/graphite, the method we propose has the advantage of being simple and fast, requiring only the acquisition of bright-field images.

Place, publisher, year, edition, pages
2016. Vol. 22, no 1, 250-256 p.
Keyword [en]
graphene, TEM, bright field, thickness maps
National Category
Materials Chemistry Engineering and Technology
Identifiers
URN: urn:nbn:se:uu:diva-299522DOI: 10.1017/S143192761501569XISI: 000377142100026PubMedID: 26915000OAI: oai:DiVA.org:uu-299522DiVA: diva2:949660
Funder
Göran Gustafsson Foundation for promotion of scientific research at Uppala University and Royal Institute of Technology
Available from: 2016-07-22 Created: 2016-07-22 Last updated: 2016-07-22Bibliographically approved

Open Access in DiVA

No full text

Other links

Publisher's full textPubMed

Search in DiVA

By author/editor
Rubino, StefanoAkhtar, SultanLeifer, Klaus
By organisation
Applied Materials Sciences
In the same journal
Microscopy and Microanalysis
Materials ChemistryEngineering and Technology

Search outside of DiVA

GoogleGoogle Scholar
The number of downloads is the sum of all downloads of full texts. It may include eg previous versions that are now no longer available

Altmetric score

Total: 60 hits
ReferencesLink to record
Permanent link

Direct link