Resonant inelastic soft-X-ray scattering at the 4d edge of Ce-based heavy-fermion materials
1999 (English)In: JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, ISSN 0368-2048, Vol. 103, 783-786 p.Article in journal (Other scientific) Published
Resonant X-ray scattering measurements were performed on CeB6, CeAl, gamma-Ce, and alpha-Ce at various incident-photon energies near the Ce 4d threshold. A pronounced inelastic scattering structure which has 4f character is observed at about 4 eV below th
Place, publisher, year, edition, pages
1999. Vol. 103, 783-786 p.
Resonant soft-X-ray scattering; Ce-based heavy-fermion systems; charge-transfer excitations; X-ray absorption; SPECTROSCOPY; EXCITATIONS; MODEL
IdentifiersURN: urn:nbn:se:uu:diva-67073OAI: oai:DiVA.org:uu-67073DiVA: diva2:94984
Addresses: Butorin SM, Univ Uppsala, Dept Phys, Box 530, S-75121 Uppsala, Sweden. Univ Uppsala, Dept Phys, S-75121 Uppsala, Sweden. Lawrence Berkeley Lab, Div Chem Sci, Berkeley, CA 94720 USA. Tohoku Univ, Dept Phys, Sendai, Miyagi 98077, Japan.2006-11-082006-11-082013-10-10