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Non-destructive chemical analysis of sandwich structures by means of soft X-ray emission
Uppsala University.
Uppsala University.
Uppsala University.
Uppsala University.
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1999 (English)In: THIN SOLID FILMS, ISSN 0040-6090, Vol. 344, 35-38 p.Article in journal (Other scientific) Published
Abstract [en]

Soft X-ray emission spectroscopy provides information about elemental composition, including the light elements, as well as the chemical bonding. The probe depth reaches hundreds of nanometers but under certain conditions considerable surface sensitivity

Place, publisher, year, edition, pages
ELSEVIER SCIENCE SA , 1999. Vol. 344, 35-38 p.
Keyword [en]
X-ray emission; depth profiling; multilayers; sputtering; FLUORESCENCE SPECTROSCOPY; TRANSMISSION; ABSORPTION; SCATTERING; REFLECTION; OXIDATION
Identifiers
URN: urn:nbn:se:uu:diva-67108OAI: oai:DiVA.org:uu-67108DiVA: diva2:95019
Note
Addresses: Galnander B, Univ Uppsala, Dept Mat Sci, Box 534, S-75121 Uppsala, Sweden. Univ Uppsala, Dept Mat Sci, S-75121 Uppsala, Sweden. Univ Uppsala, Dept Phys, S-75121 Uppsala, Sweden.Available from: 2008-10-17 Created: 2008-10-17 Last updated: 2011-01-14

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