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Bulk and interface Al 2p core excitons in GaAs/AlAs/GaAs heterostructures
Uppsala University.
Uppsala University.
Uppsala University.
Uppsala University.
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1999 (English)In: PHYSICAL REVIEW B-CONDENSED MATTER, ISSN 0163-1829, Vol. 59, no 16, 10792-10795 p.Article in journal (Other scientific) Published
Abstract [en]

Aluminum 2p soft-x-ray emission and absorption spectra (XES and XAS) of a GaAs/AIAs/GaAs heterostructure semiconductor have been measured with high-energy resolution. The Al 2p XES shows a similar feature to that of AlxGa1-xAs alloys. Strong Al 2p core ex

Place, publisher, year, edition, pages
AMERICAN PHYSICAL SOC , 1999. Vol. 59, no 16, 10792-10795 p.
Keyword [en]
X-RAY-EMISSION; ELECTRONIC-STRUCTURE; II SUPERLATTICES; QUANTUM-WELLS; ALXGA1-XAS; SEMICONDUCTORS; ABSORPTION; LAYERS
Identifiers
URN: urn:nbn:se:uu:diva-67366OAI: oai:DiVA.org:uu-67366DiVA: diva2:95277
Note
Addresses: Agui A, Univ Uppsala, Dept Phys, Box 530, S-75121 Uppsala, Sweden. Univ Tokyo, Inst Solid State Phys, Synchrotron Radiat Lab, Tanashi, Tokyo 1880002, Japan. Osaka Univ, Inst Sci & Ind Res, Ibaraki, Osaka 5670049, Japan.Available from: 2008-10-17 Created: 2008-10-17 Last updated: 2011-01-14

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