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Fluctuation-enhanced and conductometric gas sensing with nanocrystalline NiO thin films: A comparison
Uppsala University, Disciplinary Domain of Science and Technology, Technology, Department of Engineering Sciences.
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(English)Article in journal (Refereed) Submitted
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Engineering and Technology
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URN: urn:nbn:se:uu:diva-302553OAI: oai:DiVA.org:uu-302553DiVA: diva2:958117
Available from: 2016-09-06 Created: 2016-09-06 Last updated: 2016-09-20
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Gunnar, Niklasson
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