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Potentiometric measurements of copper diffusion in polycrystalline chalcocite, chalcopyrite and bornite
Uppsala University, Teknisk-naturvetenskapliga vetenskapsområdet, Chemistry, Department of Chemistry. Oorganisk kemi.
Uppsala University, Teknisk-naturvetenskapliga vetenskapsområdet, Chemistry, Department of Chemistry. Oorganisk kemi.
1996 (English)In: Solid State Ionics, Vol. 89, 269-278 p.Article in journal (Refereed) Published
Abstract [en]

Diffusion measurements have been performed by an electrochemical potentiometric method on polycrystalline synthetic chalcocite (Cu2S), chalcopyrite (CuFeS2) and bornite (Cu5FeS4) in the temperature range 5-50 degrees C. The chemical ((D) over tilde) diffusion coefficients are as follows: chalcocite 38.7 exp(-5600/T); chalcopyrite 15.4 exp(-6000/T) and bornite 14.5 exp(-4900/T).

Place, publisher, year, edition, pages
1996. Vol. 89, 269-278 p.
Keyword [en]
copper sulphides; diffusion - copper; chalcocite; chalcopyrite; bornite
Identifiers
URN: urn:nbn:se:uu:diva-69407OAI: oai:DiVA.org:uu-69407DiVA: diva2:97318
Note
Addresses: Berger R, UNIV UPPSALA, INST CHEM, DEPT INORGAN CHEM, BOX 531, S-75121 UPPSALA, SWEDEN.Available from: 2006-11-08 Created: 2006-11-08 Last updated: 2011-01-15

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