Soft X-ray emission spectroscopy
1998 (English)In: Journal of Electron Spectroscopy and Related Phenomena, ISSN 0368-2048, Vol. 92, no 1-3, 189-196 p.Article in journal (Refereed) Published
New opportunities for soft X-ray emission spectroscopy using monochromatized synchrotron radiation are illustrated with recent results from the Jülich and Uppsala groups. The classical interpretation in terms of local partial density of states is instrumental in gaining information about technically relevant materials, and especially the large photon penetration length is used to study buried structures, interfaces, impurities, and samples under pressure. Information about adsorbates is attained by means of grazing incidence excitation.
Momentum conservation in the excitation–emission scattering process is relevant for broad band materials, and gives a k-resolved projection on local angular momentum symmetries. The applicability of this band mapping method is discussed.
Energy is relevant for correlated materials with localized excitations a direct consequence is that the line widths in the spectra are limited only by the experimental resolution and the widths of the final states. The life time of the intermediate state does not limit the information content, but can instead be used as an internal time standard for studies of the dynamics.
Finally, the connection between lifetime-interference effects and the time evolution of the wavefunctions is discussed.
Place, publisher, year, edition, pages
1998. Vol. 92, no 1-3, 189-196 p.
soft X-ray emission; spectroscopy; monochromatized synchrotron radiation; UNDULATOR BEAMLINE; HIGH-RESOLUTION; SCATTERING; EXCITATION
IdentifiersURN: urn:nbn:se:uu:diva-71030DOI: 10.1016/S0368-2048(98)00121-2OAI: oai:DiVA.org:uu-71030DiVA: diva2:98941