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2017 (English)In: Ultramicroscopy, ISSN 0304-3991, E-ISSN 1879-2723, Vol. 176, p. 5-10Article in journal (Refereed) Published
Abstract [en]
We propose an experimental setup based on a streak camera approach inside an energy filter to measure time resolved properties of materials in the transmission electron microscope (TEM). In order to put in place the streak camera, a beam sweeper was built inside an energy filter. After exciting the TEM sample, the beam is swept across the CCD camera of the filter. We describe different parts of the setup at the example of a magnetic measurement. This setup is capable to acquire time resolved diffraction patterns, electron energy loss spectra (EELS) and images with total streaking times in the range between 100 ns and 10 μs.
Keywords
Time resolved; TEM; Energy filter; Streak camera; Sweep
National Category
Physical Sciences Engineering and Technology
Identifiers
urn:nbn:se:uu:diva-329982 (URN)10.1016/j.ultramic.2016.11.026 (DOI)000403992200003 ()
2017-09-252017-09-252019-12-06Bibliographically approved