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2024 (English)In: Zeitschrift fur physikalische Chemie (Munchen. 1991), ISSN 0942-9352, Vol. 238, no 11, p. 2075-2100Article in journal (Refereed) Published
Abstract [en]
We investigate the effective oxidation state and local environment of yttrium in photochromic YHO thin film structures produced by e-beam evaporation, along with their chemical structure and optical properties. Transmission electron microscopy images reveal the oxidized yttrium hydride thin film sample exhibiting a three-layered structure. X-ray photoelectron spectroscopy (XPS) measurements manifest that the oxidation state of yttrium is modified, dependent on the film's composition/depth. Furthermore, Ion beam analysis confirms that this variability is associated with a composition gradient within the film. X-ray absorption spectroscopy at the Y K-edge reveals that the effective oxidation state of yttrium is approximately +2.5 in the transparent/bleached state of YHO. Spectroscopic ellipsometry investigations showed a complex non-linear optical depth profile of the related sample confirming the dominant phase of YHO and the presence of Y(2)O(3 )and Y towards the middle of the film. The first evidence of (n; k) dispersion curves for e-beam sputtered photochromic YHO thin films are reported for transparent and dark states.
Place, publisher, year, edition, pages
Walter de Gruyter, 2024
Keywords
mixed anion materials, oxidized yttrium hydride, electronic structure, chemical bonding, e-beam evaporated photochromic thin films, depth-resolved analyses
National Category
Condensed Matter Physics Atom and Molecular Physics and Optics Materials Chemistry
Identifiers
urn:nbn:se:uu:diva-547999 (URN)10.1515/zpch-2023-0507 (DOI)001175809800001 ()2-s2.0-85186222105 (Scopus ID)
Funder
EU, Horizon 2020
2025-01-292025-01-292025-01-29Bibliographically approved