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Defect investigation of undoped wide bandgap materials: Comparison between charge transient spectroscopy (QTS) and inverse Laplace QTS
Uppsala universitet, Teknisk-naturvetenskapliga vetenskapsområdet, Tekniska sektionen, Institutionen för elektroteknik, Elektricitetslära.ORCID-id: 0009-0009-6468-0707
Uppsala universitet, Teknisk-naturvetenskapliga vetenskapsområdet, Tekniska sektionen, Institutionen för elektroteknik, Elektricitetslära.ORCID-id: 0000-0003-2197-5352
Uppsala universitet, Teknisk-naturvetenskapliga vetenskapsområdet, Tekniska sektionen, Institutionen för elektroteknik, Elektricitetslära.ORCID-id: 0000-0002-8815-5992
Uppsala universitet, Teknisk-naturvetenskapliga vetenskapsområdet, Fysiska sektionen, Institutionen för fysik och astronomi, Materialfysik.ORCID-id: 0000-0003-3100-7144
Vise andre og tillknytning
2025 (engelsk)Inngår i: Journal of Applied Physics, ISSN 0021-8979, E-ISSN 1089-7550, Vol. 137, nr 15, artikkel-id 155701Artikkel i tidsskrift (Fagfellevurdert) Published
Abstract [en]

Understanding the electrically active defects and impurities in semiconductors, especially in intrinsic or unintentionally doped wide bandgap materials, still remains a challenge. Here, time-of-flight (ToF) measurement using a solid state light source (355 and 213 nm) was performed on intrinsic silicon carbide and single-crystalline diamond. The charge transient spectroscopy (QTS) and the inverse Laplace (IL) QTS methods were applied to analyze the ToF results. Using these methods, we were able to trace the existing impurities in both materials. However, ILQTS proved to be more sensitive, with higher resolution for detection of existing multiple defects. The results suggest that this system can successfully be employed to investigate electrically active impurities at different energy states in highly resistive and undoped materials.

sted, utgiver, år, opplag, sider
American Institute of Physics (AIP), 2025. Vol. 137, nr 15, artikkel-id 155701
HSV kategori
Forskningsprogram
Teknisk fysik med inriktning mot fasta tillståndets fysik
Identifikatorer
URN: urn:nbn:se:uu:diva-555690DOI: 10.1063/5.0257511ISI: 001472585200019Scopus ID: 2-s2.0-105003023834OAI: oai:DiVA.org:uu-555690DiVA, id: diva2:1955516
Forskningsfinansiär
Swedish Energy AgencySwedish Research Council, 04186-5Carl Tryggers foundation , CTS 24:3542Tilgjengelig fra: 2025-04-30 Laget: 2025-04-30 Sist oppdatert: 2026-01-12bibliografisk kontrollert
Inngår i avhandling
1. Graphene on Diamond: Device Fabrication and Characterization for Electronics Applications
Åpne denne publikasjonen i ny fane eller vindu >>Graphene on Diamond: Device Fabrication and Characterization for Electronics Applications
2025 (engelsk)Doktoravhandling, med artikler (Annet vitenskapelig)
Alternativ tittel[en]
Graphene on Diamond for Electronic Applications : Fabrication and Characterization
Abstract [en]

Diamond and graphene are two unique carbon allotropes whose exceptional properties, extensively investigated separately, make them attractive for next-generation electronics. Diamond combines ultra-high thermal conductivity, a wide bandgap, excellent mechanical robustness, and chemical inertness, enabling efficient heat dissipation and high breakdown fields. Graphene, by contrast, is a two-dimensional material with extremely high carrier mobility and outstanding electrical conductivity arising from its Dirac-cone band structure. These attributes have sparked strong interest in integrating graphene with diamond to realize high-power, high-frequency, and quantum-compatible devices.

However, reproducible fabrication of graphene-based devices and a comprehensive understanding of the physical and chemical properties of the graphene/diamond interface are still lacking. Furthermore, the physical and chemical properties of the graphene/diamond heterostructure remain incompletely explored.

This thesis investigates two routes for forming graphene/diamond interface —rapid direct growth on (100) single-crystalline diamond (SCD) using a Nickel (Ni) catalyst at high temperature (1073 K), and wet transfer of commercial CVD graphene— and evaluates their electrical and quantum-sensing performance. Direct growth yields predominantly multilayer graphene with only ~20% monolayer coverage due to high carbon solubility in Ni, resulting in a room-temperature Hall mobility of ~79 cm2V−1s−1, underscoring challenges such as Ni dewetting and non-uniform precipitation. In contrast, transferred graphene on electronic-grade SCD with low Nitrogen concentration(< 5 ppb) attains derived hole Hall mobilities up to 2750 cm2V−1s−1 and exhibits weak temperature dependence from 80 K to 300 K, indicating that charged-impurity scattering is strongly suppressed.

Surface-termination engineering, such as plasma O-termination and thermal H-termination, further improves low-temperature mobility, increasing from 1238 to 1640 cm2V−1s−1 and reveals distinct remote-interfacial-phonon energies, ~60 meV and ~114 meV, for O- and H-termination types respectively. Electrical robustness is demonstrated by current densities exceeding 1×109 A/cm2, surpassing limits on conventional substrates such as SiO2.

Photoelectric detection of magnetic resonance (PDMR) of NV ensembles operates reliably from 77 K to 395 K, yielding a zero-field-splitting temperature coefficient dD/dT ~73 kHz/K and magnetic-field sensitivities comparable to conventional ODMR, thereby providing an on-chip electrical readout pathway for quantum sensing.

The goal is to develop a fabrication process and investigate its properties. Ultimately, this study aims to explore the potential of graphene-on-diamond for electronic devices and to identify factors that can optimize their performance.

sted, utgiver, år, opplag, sider
Uppsala: Acta Universitatis Upsaliensis, 2025. s. 81
Serie
Digital Comprehensive Summaries of Uppsala Dissertations from the Faculty of Science and Technology, ISSN 1651-6214 ; 2617
Emneord
Diamond, Graphene, Hall effect, NV centers, PDMR, surface termination.
HSV kategori
Identifikatorer
urn:nbn:se:uu:diva-571790 (URN)978-91-513-2679-5 (ISBN)
Disputas
2026-01-26, Heinz-Otto Kreis, Ångströmlaboratoriet, Regementsvägen 10, Uppsala, 13:15 (engelsk)
Opponent
Veileder
Tilgjengelig fra: 2025-12-19 Laget: 2025-11-20 Sist oppdatert: 2025-12-19
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Yamazaki, RinaIsberg, JanSuntornwipat, NattakarnMoldarev, DmitriiAitkulova, AisuluuMajdi, Saman

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